DocumentCode :
2484379
Title :
Increased Crystal Unit Resistance at Oscillator Noise Levels
Author :
Bernstein, Marvin
fYear :
1967
fDate :
1967
Firstpage :
244
Lastpage :
258
Keywords :
Capacitors; Circuit noise; Circuit testing; Crystals; Etching; Lapping; Noise level; Surface resistance; Voltage control; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
21st Annual Symposium on Frequency Control. 1967
Type :
conf
DOI :
10.1109/FREQ.1967.199669
Filename :
1536609
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2484379
