Title :
An algorithm for cancer nest feature extraction from pathological images
Author :
Hiroyasu, Tomoyuki ; Yamaguchi, Hiroaki ; Fujita, Sosuke ; Miki, Mitsunori ; Yoshimi, Masato ; Ogura, Maki ; Fukumoto, Manabu
Author_Institution :
Dept. of Life & Med. Sci., Doshisha Univ., Kyotanabe, Japan
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Here, we propose an algorithm to automatically obtain extraction filters for the affected regions from cancer images. The proposed algorithm consists of two steps: extraction of affected region candidates and elimination of false positives. Useful features of cancer images, such as the area and degree of circularity of cancer nests, etc., are extracted using the derived filters. These features are useful for supporting pathological diagnosis. Automatic Construction of Tree-structural Image Transformation (ACTIT) was used to construct these filters to extract the affected regions from the image. The proposed algorithm was applied to a mouth cancer pathological image. The results confirmed that the proposed algorithm can obtain good filters capable of extracting cancer nests. The derived filters were also applied to other images from the same specimen. The results also indicated that the generated filters show general versatility in extracting cancer nest candidates. The area and degree of circularity of the cancer nets were also derived automatically.
Keywords :
biomedical optical imaging; cancer; feature extraction; medical image processing; ACTIT; Automatic Construction of Tree Structural Image Transformation; affected region candidate extraction; cancer images; cancer nest area; cancer nest circularity degree; cancer nest feature extraction algorithm; extraction filters; false positive elimination; mouth cancer pathological image; pathological images; Cancer; Educational institutions; Feature extraction; Mouth; Pathology; Topology; Vegetation; Algorithms; Automation; Humans; Neoplasms;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090926