DocumentCode :
248451
Title :
Example-based super-resolution using self-patches and approximated constrained least squares filter
Author :
Changhun Cho ; Jaehwan Jeon ; Joonki Paik
Author_Institution :
Image Process. & Intell. Syst. Lab., Chung-Ang Univ., Seoul, South Korea
fYear :
2014
fDate :
27-30 Oct. 2014
Firstpage :
2140
Lastpage :
2144
Abstract :
This paper presents a novel super-resolution (SR) algorithm using local self-examples. The proposed algorithm consists of three steps: i) generation of the patch dictionary using multiple-step image blurring, ii) search of the optimum patches using the magnitude and orientation of the image gradient, and iii) combination of the restored and original patches for reducing the patch-mismatching error. Example-based SR methods have a common disadvantage of unnaturally reconstructed edges. The proposed method can reconstruct realistic images by searching patches based on the edge strength in dictionary made by multiple-step degradations. Experimental results show that the proposed SR algorithm provides more natural images with less synthetic artifacts than existing methods. The proposed SR method provides significant improvement in both subjective and objective measures including peak-to-peak signal-to-noise ratio (PSNR) and structural similarity measure (SSIM).
Keywords :
gradient methods; image reconstruction; image resolution; image restoration; least squares approximations; PSNR; SR algorithm; SSIM; approximated constrained least squares filter; edge reconstruction; edge strength; example based super resolution; image blurring; image gradient; patch dictionary; patch mismatching error; peak-to-peak signal-to-noise ratio; searching patches; structural similarity measure; Degradation; Dictionaries; Image edge detection; Image resolution; Image restoration; PSNR; Signal resolution; Super-resolution; image restoration; self-examples; stepwise degradation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
Type :
conf
DOI :
10.1109/ICIP.2014.7025429
Filename :
7025429
Link To Document :
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