• DocumentCode
    2484598
  • Title

    Model of surface flashover of insulator in vacuum

  • Author

    Belyaev, V.

  • Author_Institution
    Lab. Tech. & Electrophys. of High Voltages, Nat. Tech. Univ. of Ukraine, Kyiv, Ukraine
  • Volume
    1
  • fYear
    1998
  • fDate
    17-21 Aug 1998
  • Firstpage
    151
  • Abstract
    Model of surface flashover based on the assumption that discharge develops in a layer of gas desorbed from the insulator surface is proposed. The conditions of avalanche-type increasing of current and of gas density near the insulator surface are analyzed. The surface charge, which appears when the insulator is subjected to high voltages, is taken into consideration. According to the model, surface flashover occurs when the ionization multiplication coefficient, determined by electrons emitted from a cathode junction, exceeds critical size. A necessary condition of flashover is the appearance of a powerful electron emission source at the cathode-insulator junction. The proposed model allows calculation of the flashover voltage and other flashover characteristics of insulators which have considerable value of electron emission yield (e.g. Al2O3 ceramic)
  • Keywords
    cathodes; electron emission; flashover; insulators; ionisation; surface charging; vacuum breakdown; Al2O3 ceramic; avalanche-type current increase; cathode junction; cathode-insulator junction; desorbed gas layer; discharge development; electron emission yield; electrons emission; flashover voltage; gas density increase; high voltage; insulator; insulator surface; ionization multiplication coefficient; powerful electron emission source; surface charge; surface flashover; surface flashover model; vacuum; Cathodes; Dielectrics; Electron emission; Flashover; Gas insulation; Ionization; Surface charging; Surface discharges; Surface finishing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
  • Conference_Location
    Eindhoven
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-3953-3
  • Type

    conf

  • DOI
    10.1109/DEIV.1998.740596
  • Filename
    740596