DocumentCode
2484701
Title
AC-DC difference of millivolt thermal standards
Author
De-Xiang Huang
Author_Institution
Ballantine Labs. Inc., Cedar Knolls, NJ, USA
fYear
1996
fDate
17-21 June 1996
Firstpage
578
Lastpage
579
Abstract
The error sources of AC-DC differences of millivolt thermal standards-micropotentiometers (/spl mu/pot´s)-and the step down calibrations of /spl mu/pot´s from 20 Hz to 1 MHz are analyzed. The new step down method for sub-mV ranges significantly reduces the /spl mu/pot´s uncertainty.
Keywords
calibration; measurement errors; measurement standards; potentiometers; thin film resistors; voltage measurement; 0.5 to 5 mV; 20 Hz to 1 MHz; AC-DC difference; disk resistors; error sources; micropotentiometers; millivolt thermal standards; primary standard; skin effect; step down calibrations; sub-mV ranges; thermal voltage converters; uncertainty reduction; Calibration; Current measurement; Dielectric losses; Frequency; Impedance; Resistors; Skin effect; Tellurium; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.547358
Filename
547358
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