• DocumentCode
    2484824
  • Title

    Laser damage of optics in high power manufacturing applications. The road from single-shot to billion-shot performance

  • Author

    Krajnovich, D.J. ; Pour, I.K. ; Pocker, D.J. ; Tam, A.C. ; Leung, W.P. ; Kulkarni, M.V.

  • Author_Institution
    IBM Almaden Res. Center, San Jose, CA, USA
  • fYear
    1993
  • fDate
    15-18 Nov 1993
  • Firstpage
    780
  • Lastpage
    781
  • Abstract
    This paper reviews damage induced by pulsed excimer lasers. Most previous damage studies have addressed the "time-zero" performance limits of optical materials, i.e., virgin samples exposed to one or a small number of laser pulses. In this "single-shot" damage regime, coatings are almost always the weakest link in the optical system. Considerable progress has been made in identifying optimum coating materials and material combinations for particular wavelengths, and in exploring effects of undercoats and overcoats, non-quarter-wave designs, laser pre-conditioning, and alternate polishing and deposition methods on the measured damage threshold. However, adequate single-shot damage resistance is a necessary but not sufficient condition for many practical applications
  • Keywords
    excimer lasers; laser accessories; laser materials processing; manufacture; optical films; polishing; billion-shot performance; coatings; deposition methods; high power manufacturing applications; laser damage; laser materials processing; laser pre-conditioning; measured damage threshold; non-quarter-wave designs; optical materials; optics; optimum coating materials; overcoats; polishing; pulsed excimer lasers; reviews; single-shot damage resistance; undercoats; Coatings; Electrical resistance measurement; Manufacturing; Optical design; Optical materials; Optical pulses; Particle measurements; Power lasers; Pulsed laser deposition; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-1263-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1993.379424
  • Filename
    379424