Title :
Ultrafast scanning probes for electronic measurement
Author :
Bloom, D.M. ; Hou, A.S. ; Ho, F.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
We have developed a scanning force microscope probe for measuring ultrafast voltage signals and demonstrated equivalent-time sampling with 100 ps time resolution and non invasive probing though a passivating layer
Keywords :
atomic force microscopy; microscopy; probes; signal sampling; voltage measurement; 100 ps; electronic measurement; equivalent-time sampling; noninvasive probing; passivating layer; scanning force microscope; ultrafast scanning probes; voltage signals; Atomic force microscopy; Circuits; Clocks; Coplanar waveguides; Force measurement; Probes; Pulse generation; Pulse measurements; Sampling methods; Voltage;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
DOI :
10.1109/LEOS.1993.379437
