DocumentCode
2485019
Title
Ultrafast scanning probes for electronic measurement
Author
Bloom, D.M. ; Hou, A.S. ; Ho, F.
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fYear
1993
fDate
15-18 Nov 1993
Firstpage
804
Lastpage
805
Abstract
We have developed a scanning force microscope probe for measuring ultrafast voltage signals and demonstrated equivalent-time sampling with 100 ps time resolution and non invasive probing though a passivating layer
Keywords
atomic force microscopy; microscopy; probes; signal sampling; voltage measurement; 100 ps; electronic measurement; equivalent-time sampling; noninvasive probing; passivating layer; scanning force microscope; ultrafast scanning probes; voltage signals; Atomic force microscopy; Circuits; Clocks; Coplanar waveguides; Force measurement; Probes; Pulse generation; Pulse measurements; Sampling methods; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location
San Jose, CA
Print_ISBN
0-7803-1263-5
Type
conf
DOI
10.1109/LEOS.1993.379437
Filename
379437
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