Title :
Repeatability of surface EMG-based single parameter muscle fatigue assessment strategies in static and cyclic contractions
Author :
Zaman, Sabeer A. ; MacIsaac, Dawn T. ; Parker, Philip A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
The repeatability of a spectral surface electromyography-based fatigue assessment strategy was evaluated. Variability of two fatigue-trend tracking parameters was used as an indicator for repeatability. The parameters were the natural logarithm of the slope of linear mean frequency decline lnMFS and the percent drop in mean frequency MFD. The coefficient of variation CoV was used as the metric for repeatability, representing the ratio of the standard deviation to the mean of repeated measures from the same individual. Five weekly fatigue tests on the right biceps brachii were conducted on 11 participants with a fatiguing regime comprising of alternating static and cyclic segments, collecting seven channels of differential EMG. The resulting 95% confidence intervals of the CoV were: 15.38-24.87% (Static lnMFS), 12.21-23.36% (Cyclic lnMFS), 13.18-21.85% (Static MFD), and 12.37-24.39% (Cyclic MFD). There was no statistically significant difference in repeatability between any combination of parameter and types of motion.
Keywords :
biomechanics; electromyography; fatigue; fatigue testing; coefficient of variation; cyclic contractions; fatigue tests; natural logarithm; right biceps brachii; spectral surface electromyography-based fatigue assessment strategy; static contractions; surface EMG-based single parameter muscle fatigue assessment; Analysis of variance; Atmospheric measurements; Electrodes; Electromyography; Fatigue; Muscles; Particle measurements; Adult; Analysis of Variance; Electromyography; Female; Humans; Male; Muscle Fatigue; Reproducibility of Results;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090958