DocumentCode :
2485209
Title :
Evaluation of higher order statistics parameters for multi channel sEMG using different force levels
Author :
Naik, Ganesh R. ; Kumar, Dinesh K.
Author_Institution :
Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
3869
Lastpage :
3872
Abstract :
The electromyograpy (EMG) signal provides information about the performance of muscles and nerves. The shape of the muscle signal and motor unit action potential (MUAP) varies due to the movement of the position of the electrode or due to changes in contraction level. This research deals with evaluating the non-Gaussianity in Surface Electromyogram signal (sEMG) using higher order statistics (HOS) parameters. To achieve this, experiments were conducted for four different finger and wrist actions at different levels of Maximum Voluntary Contractions (MVCs). Our experimental analysis shows that at constant force and for non-fatiguing contractions, probability density functions (PDF) of sEMG signals were non-Gaussian. For lesser MVCs (below 30% of MVC) PDF measures tends to be Gaussian process. The above measures were verified by computing the Kurtosis values for different MVCs.
Keywords :
biomechanics; biomedical electrodes; electromyography; force measurement; higher order statistics; probability; electrode position; electromyograpy signal; finger action; force level; higher order statistics parameter; kurtosis value; maximum voluntary contraction; motor unit action potential; multichannel sEMG; muscle contraction level; muscle signal; nonGaussian process; nonfatiguing contraction; probability density function; surface electromyogram signal; wrist action; Electrodes; Electromyography; Estimation; Fingers; Force; Muscles; Probability density function; Action Potentials; Electromyography; Humans; Muscle Contraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6090961
Filename :
6090961
Link To Document :
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