• DocumentCode
    2485307
  • Title

    A study of factors and mechanisms responsible for the de-metallization of polypropylene films used in dry capacitors

  • Author

    Kahouli, A. ; Lesaint, O. ; Gallot-Lavallée, O. ; Rain, P. ; Guillermin, C.

  • Author_Institution
    Grenoble Electr. Eng. Lab., Grenoble Univ., Grenoble, France
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    688
  • Lastpage
    691
  • Abstract
    Metalized polypropylene films are used to build power capacitors for ac voltage. The objective of this paper is to study the de-metallization processes that may occur under high electric field. A laboratory model of capacitor is first described. It allows us to visualize the de-metallization and record the corresponding capacitance loss, under various conditions of applied voltage, frequency, mechanical pressure, and gas nature. Four different de-metallization processes can be observed. The residual gas layer existing between films has a primary importance. Replacing air by nitrogen shows that the de-metallization is basically due to the oxidation of the metal.
  • Keywords
    oxidation; power capacitors; AC voltage; applied voltage; capacitance loss; capacitor laboratory model; dry capacitors; electric field; mechanical pressure; metalized polypropylene films; polypropylene film de-metallization process; power capacitors; residual gas layer; Capacitance; Capacitors; Films; Force; Metals; Partial discharges; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4673-1253-0
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2012.6378874
  • Filename
    6378874