• DocumentCode
    2485591
  • Title

    Feature extraction method based on cascade noise elimination for sketch recognition

  • Author

    Yang, Junyeong ; Byun, Hyeran

  • Author_Institution
    Dept. of Comput. Sci., Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Freehand sketching is a very efficient means for us to communicate each other. As table PC is widely popularized, the research about sketch recognition became one of important research issue. To recognize sketch, the feature point should be extracted and then each feature point is analyzed as line or curve. However, most of feature extraction algorithms suffers from noise which is occurred from the bad drawing sketch. In this paper, we propose the feature extraction algorithm robust to noise. The proposed algorithm consists of three cascade steps: candidate feature point extraction, noise reduction, and hook elimination. At the candidate feature point extraction step, the feature points is selected among input points. Then, in second step, we reduce the noise which is occurred from the previous step by using noise reduction rule based on inner product between two neighbor vectors. Finally, the hook, which can not be eliminated from two previous steps, is eliminated by the proposed hook elimination method. The experimental result shows that the average approximation error is less than 1 about 1004 line-curve hybrid shapes, and the proposed algorithm is the good feature methods.
  • Keywords
    feature extraction; image denoising; image recognition; candidate feature point extraction; cascade noise elimination; hook elimination; noise reduction; sketch recognition; table PC; Approximation algorithms; Approximation error; Clustering algorithms; Computer science; Feature extraction; Feedback; Noise reduction; Noise robustness; Shape; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-2174-9
  • Electronic_ISBN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2008.4761630
  • Filename
    4761630