• DocumentCode
    2485606
  • Title

    Nonhyperbolic Reflection Traveltimes and Moveouts in Anisotropic VTI Media

  • Author

    Yang Cun ; Zhang Junhua ; Meng Xianjun ; Wang Lixin ; Lv Xiaowei

  • Author_Institution
    Coll. of Geo-Resource & Inf., China Univ. of Pet., Dongying, China
  • fYear
    2010
  • fDate
    22-23 May 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The hyperbolic approximation of P-wave reflection traveltimes in common-midpoint gathers plays an important role in conventional seismic data processing and interpretation. It is well known that the normal moveout formula is based upon homogeneous isotropic media. The familiar hyperbolic approximation of P-wave reflection moveout is exact for homogeneous isotropic or elliptically anisotropic media above a planar reflector. Any realistic combination of heterogeneity, anisotropic coefficient, and nonelliptic anisotropy will cause departures from hyperbolic moveout at large offsets. Therefore, nonhyperbolic moveout gives exact traveltimes for elliptically anisotropic media overlaying a plane dipping reflector. In this paper, we compare a theoretical description of P-wave reflection traveltimes and degree of nonhyperbolic moveout with different anisotropic parameters.
  • Keywords
    seismic waves; seismology; P-wave reflection moveout; P-wave reflection traveltimes; anisotropic VTI media; anisotropic coefficient; anisotropic parameters; common-midpoint; conventional seismic data interpretation; conventional seismic data processing; elliptically anisotropic media; homogeneous isotropic media; hyperbolic approximation; nonhyperbolic moveout; nonhyperbolic reflection traveltimes; normal moveout formula; plane dipping reflector; Anisotropic magnetoresistance; Data processing; Educational institutions; Petroleum; Random media; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5872-1
  • Electronic_ISBN
    978-1-4244-5874-5
  • Type

    conf

  • DOI
    10.1109/IWISA.2010.5473626
  • Filename
    5473626