DocumentCode :
2485615
Title :
Periodic piecewise linear excitation for ADC testing
Author :
Ong, Tat Chern ; Tee, Min Tong ; Kuang, Ye Chow ; Ooi, Melanie Po-Leen ; Demidenko, Serge
Author_Institution :
Monash Univ. Sunway Campus, Bandar Sunway, Malaysia
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
2285
Lastpage :
2290
Abstract :
Piecewise linear waveforms have the advantage of being accurate and easy to generate while employing relatively simple circuitry. This make it attractive to consider piecewise linear functions as test signals for high performance ADC testing. In this paper a new set of periodic piecewise linear basis functions are presented and evaluated to assess the convergence quality, jitter detection, incoherent sampling response, spectral analysis, and phase shift sensitivity.
Keywords :
analogue-digital conversion; jitter; phase shifters; piecewise linear techniques; convergence quality; high performance ADC testing; incoherent sampling response; jitter detection; phase shift sensitivity; piecewise linear functions; spectral analysis; test signals; Convergence; Harmonic distortion; Jitter; Sensitivity; Testing; Time frequency analysis; ADC testing; Piecewise linear waveform; basis function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229680
Filename :
6229680
Link To Document :
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