• DocumentCode
    2485683
  • Title

    Geographic atrophy segmentation in infrared and autofluorescent retina images using supervised learning

  • Author

    Devisetti, K. ; Karnowski, T.P. ; Giancardo, L. ; Li, Y. ; Chaum, E.

  • Author_Institution
    Univ. of Tennessee Health Sci. Center, Memphis, TN, USA
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    3958
  • Lastpage
    3961
  • Abstract
    Geographic Atrophy (GA) of the retinal pigment epithelium (RPE) is an advanced form of atrophic age-related macular degeneration (AMD) and is responsible for about 20% of AMD-related legal blindness in the United States. Two different imaging modalities for retinas, infrared imaging and autofluorescence imaging, serve as interesting complimentary technologies for highlighting GA. In this work we explore the use of neural network classifiers in performing segmentation of GA in registered infrared (IR) and autofluorescence (AF) images. Our segmentation achieved a performance level of 82.5% sensitivity and 92.9% specificity on a per-pixel basis using hold-one-out validation testing. The algorithm, feature extraction, data set and experimental results are discussed and shown.
  • Keywords
    biomedical optical imaging; eye; feature extraction; fluorescence; geriatrics; image classification; image segmentation; infrared imaging; learning (artificial intelligence); medical disorders; medical image processing; neural nets; atrophic age related macular degeneration; autofluorescence imaging; autofluorescent retina image; feature extraction; geographic atrophy segmentation; imaging modality; infrared imaging; infrared retina image; legal blindness; neural network classifier; retinal pigment epithelium; supervised learning; Atrophy; Feature extraction; Image segmentation; Optical imaging; Retina; Supervised learning; Geographic Atrophy; Humans; Learning; Neural Networks (Computer); Retina;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6090983
  • Filename
    6090983