• DocumentCode
    2485793
  • Title

    Broadband characterization of carbon nanotube networks

  • Author

    Decrossas, Emmanuel ; EL Sabbagh, Mahmoud A. ; Hanna, Victor Fouad ; El-Ghazaly, Samir M.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    208
  • Lastpage
    211
  • Abstract
    In this paper, the complex permittivity of carbon nanotube networks is extracted over a broadband of frequencies using a non destructive, simple, and low-cost procedure. The structure holding the material under test is a hollow circular waveguide shorted at one end and connected through precision adapter to the 1.85 mm-50-Ω coaxial cable of performance network analyzer. In this testing configuration, discontinuities between different transmission lines are modeled based on the full-wave mode matching technique. In this modeling, all higher-order modes propagating and evanescent are considered in the computation which produces generalized scattering matrices (GSMs). A gradient-optimization method is used to solve the inverse problem and extract the complex permittivity of material under test from the measured magnitude and phase of reflection coefficient. The technique is general and requires only a small fraction of material under test which can be in liquid, pulverized or solid form.
  • Keywords
    carbon nanotubes; circular waveguides; gradient methods; inverse problems; transmission lines; broadband characterization; carbon nanotube networks; full-wave mode matching technique; generalized scattering matrices; gradient-optimization method; hollow circular waveguide; inverse problem; material under test permittivity; resistance 50 ohm; size 1.85 mm; transmission lines; Carbon nanotubes; Materials; Microwave measurements; Permittivity; Permittivity measurement; Temperature measurement; Transmission line measurements; Broadband measurements; carbon nanotube; coaxial transmission line discontinuities; mode matching methods; nanotechnology; permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711273
  • Filename
    5711273