Title :
Two-Dimensional Logistic Regression
Author :
Yun, Woo-han ; Kim, Do-Hyung ; Chi, Su-Young ; Yoon, Ho-Sub
Author_Institution :
Electron. & Telecommun. Res. Inst, Daejeon
Abstract :
Recently, some 2D based algorithms were proposed for image classification. In this paper, we propose two-dimensional logistic regression for two-class problem. This method has an advantage of memory saving and better performance than other 2D based approaches. The experimental results show two dimensional logistic regression is superior to one dimensional logistic regression and other popular two-dimensional methods.
Keywords :
image classification; regression analysis; image classification; logistic regression; memory saving; Artificial intelligence; Databases; Feature extraction; Image classification; Image recognition; Independent component analysis; Intelligent robots; Logistics; Principal component analysis; Vectors;
Conference_Titel :
Tools with Artificial Intelligence, 2007. ICTAI 2007. 19th IEEE International Conference on
Conference_Location :
Patras
Print_ISBN :
978-0-7695-3015-4
DOI :
10.1109/ICTAI.2007.48
