• DocumentCode
    2485902
  • Title

    Eddy currents testing defect characterization based on non-linear regressions and artificial neural networks

  • Author

    Rosado, Luis ; Janeiro, Fernando M. ; Ramos, Pedro M. ; Piedade, Moisés

  • Author_Institution
    Inst. de Telecomun., UTL, Lisboa, Portugal
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    2419
  • Lastpage
    2424
  • Abstract
    Feature extraction and defect parameters estimation from eddy current testing data has received special attention in the last years. Principal component analysis, wavelet decomposition and Fourier descriptors are some of the tools used for feature extraction. Particular interest is devoted to using artificial neural networks to perform parameters estimation and profile reconstruction of defects. This work reports the use of non-linear regressions for feature extraction based on the modeling of the measured response by a set of additive Gaussians and artificial neural networks to estimate the width and depth of defects.
  • Keywords
    Fourier transforms; Gaussian processes; eddy current testing; feature extraction; materials science computing; neural nets; principal component analysis; regression analysis; wavelet transforms; Fourier descriptor; additive Gaussian; artificial neural network; defect characterization; defect depth estimation; defect parameter estimation; defect profile reconstruction; defect width estimation; eddy current testing; feature extraction; nonlinear regression; principal component analysis; wavelet decomposition; Artificial neural networks; Coils; Feature extraction; Neurons; Probes; Training; Voltage measurement; Defect Parameter Estimation; Eddy Current Testing; Feature Extraction; Non-Linear Regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
  • Conference_Location
    Graz
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4577-1773-4
  • Type

    conf

  • DOI
    10.1109/I2MTC.2012.6229696
  • Filename
    6229696