• DocumentCode
    2485919
  • Title

    Fast calculation of dielectric substrate losses in microwave applications by the FD2TD method using a new formalism

  • Author

    Buccella, C. ; De Santis, V. ; Feliziani, M. ; Maradei, F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of L´´Aquila, L´´Aquila, Italy
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    The paper deals with the electromagnetic characterization of a dielectric substrate by a numerical analysis. The electromagnetic analysis is performed by a frequency-dependent finite difference time domain (FD2TD) method with a new formulation. A multi-pole Debye dispersive relation is used to model frequency-dependent properties of dispersive dielectrics. The proposed method is suitable to predict efficiently substrate dielectric losses in microwave and RF applications.
  • Keywords
    dielectric losses; finite difference time-domain analysis; microwave devices; substrates; FD2TD method; RF application; dielectric substrate losses; dispersive dielectrics; electromagnetic analysis; electromagnetic characterization; frequency-dependent finite difference time domain method; frequency-dependent properties; microwave applications; multipole Debye dispersive relation; numerical analysis; substrate dielectric losses; Current density; Dielectric losses; Dispersion; Media; Time domain analysis; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711280
  • Filename
    5711280
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2485919