• DocumentCode
    2485971
  • Title

    A machine learning based scheme for double JPEG compression detection

  • Author

    Chen, Chunhua ; Shi, Yun Q. ; Su, Wei

  • Author_Institution
    New Jersey Inst. of Technol., Newark, NJ
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Double JPEG compression detection is of significance in digital forensics. We propose an effective machine learning based scheme to distinguish between double and single JPEG compressed images. Firstly, difference JPEG 2D arrays, i.e., the difference between the magnitude of JPEG coefficient 2D array of a given JPEG image and its shifted versions along various directions, are used to enhance double JPEG compression artifacts. Markov random process is then applied to modeling difference 2-D arrays so as to utilize the second-order statistics. In addition, a thresholding technique is used to reduce the size of the transition probability matrices, which characterize the Markov random processes. All elements of these matrices are collected as features for double JPEG compression detection. The support vector machine is employed as the classifier. Experiments have demonstrated that our proposed scheme has outperformed the prior arts.
  • Keywords
    Markov processes; data compression; higher order statistics; image classification; image coding; image segmentation; learning (artificial intelligence); probability; random processes; support vector machines; JPEG 2D array; Markov random process; double JPEG compression detection; image classification; machine learning based scheme; probability matrix; second-order statistic; support vector machine; thresholding technique; Art; Digital forensics; Image coding; Machine learning; Probability; Random processes; Statistics; Support vector machine classification; Support vector machines; Transform coding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-2174-9
  • Electronic_ISBN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2008.4761645
  • Filename
    4761645