Title :
A random set method of circuit tolerance analysis
Author :
Xu, Xiaobin ; Wen, Chenglin
Author_Institution :
Dept. of Electr. & Autom., Shanghai Maritime Univ., Shanghai
Abstract :
Monte Carlo analysis has been an accepted method for circuit tolerance analysis, but the heavy computational complexity has always prevented its applications. Based on random set theory, this paper presents a simple and flexible tolerance analysis method to estimate circuit yield. It is the alternative to Monte Carlo analysis, but reduces the number of calculations drastically.
Keywords :
Monte Carlo methods; computational complexity; network analysis; set theory; Monte Carlo analysis; circuit tolerance analysis; computational complexity; random set method; random set theory; Automation; Computational complexity; Electrical products; Electronic components; Flexible printed circuits; Monte Carlo methods; Sampling methods; Set theory; Tolerance analysis; Yield estimation; Circuit yield; Evidence theory Tolerance analysis; Monte Carlo analysis; Random set theory;
Conference_Titel :
Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-2113-8
Electronic_ISBN :
978-1-4244-2114-5
DOI :
10.1109/WCICA.2008.4593488
