• DocumentCode
    2486207
  • Title

    A random set method of circuit tolerance analysis

  • Author

    Xu, Xiaobin ; Wen, Chenglin

  • Author_Institution
    Dept. of Electr. & Autom., Shanghai Maritime Univ., Shanghai
  • fYear
    2008
  • fDate
    25-27 June 2008
  • Firstpage
    3554
  • Lastpage
    3559
  • Abstract
    Monte Carlo analysis has been an accepted method for circuit tolerance analysis, but the heavy computational complexity has always prevented its applications. Based on random set theory, this paper presents a simple and flexible tolerance analysis method to estimate circuit yield. It is the alternative to Monte Carlo analysis, but reduces the number of calculations drastically.
  • Keywords
    Monte Carlo methods; computational complexity; network analysis; set theory; Monte Carlo analysis; circuit tolerance analysis; computational complexity; random set method; random set theory; Automation; Computational complexity; Electrical products; Electronic components; Flexible printed circuits; Monte Carlo methods; Sampling methods; Set theory; Tolerance analysis; Yield estimation; Circuit yield; Evidence theory Tolerance analysis; Monte Carlo analysis; Random set theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-2113-8
  • Electronic_ISBN
    978-1-4244-2114-5
  • Type

    conf

  • DOI
    10.1109/WCICA.2008.4593488
  • Filename
    4593488
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2486207