Title :
Simulated characteristics of optical electric field probe
Author :
Ikenaga, Tomokazu ; Ota, Hiroyasu ; Arai, Ken Ichi
Author_Institution :
Sendai Res. Center Nat. Inst. of Inf. & Commun. Technol., Sendai, Japan
Abstract :
To perform electric near-field measurements with high accuracy in the gigahertz frequency range, we are developing an optical electric field probe by employing an electrooptic crystal and a laser beam for signal transmission. In this paper, we report the results of a FDTD (Finite Difference Time Domain) simulation of the invasiveness of probes when measuring the electric field distribution above a microstrip line (MSL). The purpose is to verify the measurement accuracy and clarify the design guidelines for optical electric field probes.
Keywords :
crystals; electric field measurement; electro-optical devices; finite difference time-domain analysis; measurement by laser beam; microstrip lines; microwave measurement; millimetre wave measurement; probes; FDTD simulation; electric near-field measurement; electrooptic crystal; finite difference time domain; gigahertz frequency range; laser beam; microstrip line; optical electric field probe; signal transmission; Crystals; Electric fields; Laser beams; Measurement by laser beam; Optical polarization; Optical variables measurement; Probes; Electric field distribution; FDTD; Microstrip line; Optical electric field probe;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
978-1-4244-6305-3
DOI :
10.1109/ISEMC.2010.5711294
