Title :
Field injection probes for field coupled Electrostatic Discharge sensitivity database of ICs
Author :
Li, Zhen ; Xiao, Jiang ; Seol, Byongsu ; Lee, Jongsung ; Pommerenke, David
Author_Institution :
Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.
Keywords :
electrostatic discharge; integrated circuits; IC location soft-error; field coupled electrostatic discharge sensitivity database; field injection probes; integrated circuit; Databases; Electrostatic discharge; Integrated circuits; Inverters; Magnetic field measurement; Probes; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
978-1-4244-6305-3
DOI :
10.1109/ISEMC.2010.5711295
