DocumentCode :
2486289
Title :
Measurement method for failure prognosis in lead-free interconnections
Author :
Catelani, Marcantonio ; Scarano, Valeria L.
Author_Institution :
Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
483
Lastpage :
487
Abstract :
The specification of a reliability criterion for solder joints is an important element in the qualification of an electronic product, in particular for the new lead-free alloys. A common approach to reliability evaluation for soldering is to monitor electrical resistance after, or better during, the testing. The techniques employed for DC resistance monitoring will capture information regarding transients or long-term drift. This paper reviews and assesses the DC resistance monitoring during reliability testing of lead-free solder material used for the implementation of an ultrasound transducer. An experimental study on a transducers implemented with soldering made up by In-Sn was performed to compare reliability performance with Sn-Pb soldering and measurement techniques. Moreover we would propose to use a method for failure prognosis, considering measurements with changes of frequency, in order to evaluate the possibility to identify the failure occurrence earlier than the DC resistance.
Keywords :
alloys; indium compounds; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; solders; tin compounds; transducers; DC resistance monitoring; In-Sn; Sn-Pb; Sn-Pb soldering; electrical resistance monitoring; electronic product qualification; failure prognosis; lead-free alloy; lead-free interconnection; lead-free solder material; measurement method; reliability criterion specification; reliability evaluation; reliability performance; reliability testing; solder joint; ultrasound transducer; Electrical resistance measurement; Integrated circuit interconnections; Metals; Monitoring; Reliability; Resistance; Soldering; interconnections; lead-free; measurement method; prognosis; reliability; soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229718
Filename :
6229718
Link To Document :
بازگشت