• DocumentCode
    2486293
  • Title

    Systematic design technique for improvements of mobile phone´s immunity to electrostatic discharge soft failures

  • Author

    Kim, Ki Hyuk ; Koo, Jeong-Hoi ; Kang, Bong-Gyu ; Kwon, Soon Jae ; Kim, Yongsup ; Jeong, Joongho

  • Author_Institution
    DMC R&D Center, Samsung Electron. Co., Ltd., Suwon, South Korea
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    348
  • Lastpage
    353
  • Abstract
    A systematic design technique for the improvements of the mobile phone´s immunity to the electrostatic discharge (ESD) soft failures is proposed. The design technique consists of two parallel processes; one is the ESD simulation and the other is the ESD characterization. The modeling methods of the mobile phone, the ESD gun and the ESD testing setup for the ESD simulations are also developed. The proposed technique is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phone and the root causes of the ESD soft failure are analyzed based on the proposed technique. The RC low pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage level reductions of the signals which cause the ESD soft failure. The improved mobile phone´s ESD immunity is characterized again and no ESD soft failure is detected.
  • Keywords
    electrostatic discharge; low-pass filters; mobile radio; ESD gun; ESD simulations; ESD testing; RC low pass filters; electrostatic discharge soft failures; slide-type mobile phone; Analytical models; Batteries; Electrostatic discharge; Integrated circuit modeling; Mobile communication; Mobile handsets; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711299
  • Filename
    5711299