Title :
A physiologically and biomechanically approximate model for surface electromyography amplitude estimation
Author :
Choi, Changmok ; Lee, Hae-Dong ; Kim, Jung
Author_Institution :
Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Surface electromygraphy (sEMG) provides information of the neural drive to the muscle, so muscle force estimation by sEMG is of high relevance in biomechanical studies and in bionic applications. Even though mean absolute value (MAV) has been widely used for sEMG amplitude estimation due to the probabilistic nature of sEMG, but it has been used without any comprehensive physiological justification. A physiologically and biomechanically approximate model for the force estimation would enable a clear understanding of the relationships between sEMG and the force, and it can be used as sEMG amplitude estimation method. We proposed a new sEMG amplitude estimation method comprising two procedures: MUAP (motor unit action potential) event detection and muscle force indication using a biomechanical muscle model. The estimation performances were evaluated with nine subjects and compared with MAV. The performance (R2) of the proposed method (0.94 ± 0.03) outperformed it of MAV (0.90 ± 0.02). The method we proposed should be widely applicable to quantitatively analysis muscle activities by sEMG.
Keywords :
biomechanics; biomedical measurement; electromyography; force measurement; neuromuscular stimulation; physiological models; biomechanically approximate model; bionic application; motor unit action potential event detection; muscle force estimation; muscle force indication; neural drive; surface electromyography amplitude estimation; Biomechanics; Electromyography; Estimation; Force; Force measurement; Mathematical model; Muscles; Biomechanics; Electromyography; Humans; Models, Theoretical; Muscles;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091015