DocumentCode :
2486378
Title :
Effects of channel length on calculation accuracy of lightning return stroke electromagnetic fields
Author :
Ding, Tongyu ; Zhang, Shaoqing ; Wu, Qun
Author_Institution :
Sch. of Electron. & Inf. Eng., Harbin Inst. of Technol., Harbin, China
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
374
Lastpage :
377
Abstract :
Finite-difference time-domain (FDTD) method has been widely used in the calculation of lightning generated electromagnetic fields, and the length of lightning discharge channel is usually set to be 2500~3000m according to the height of cloud layer, this is rather time consuming. In order to save the computation time, we shorten the channel length to 1000m, calculate the electric and magnetic fields at flat ground due to lightning return stroke. To compare the results with those of H=2500m, we found that, the error caused by the shortening only occurs in the decreasing period of the lightning waveforms, and the relative error of Ez is about 3% for near field, while the computation time is only 1/3 of that calculated with H=2500m. This analysis of relative error and calculation accuracy will provide more comprehensive criterions on computational parameters for lightning electromagnetic pulse.
Keywords :
atmospheric electromagnetic wave propagation; clouds; discharges (electric); electromagnetic fields; electromagnetic pulse; finite difference time-domain analysis; lightning; waveform analysis; FDTD method; channel length effect; cloud layer; electric field; finite-difference time-domain method; lightning discharge channel; lightning electromagnetic pulse; lightning generated electromagnetic field; lightning return stroke; lightning waveform; magnetic field; Electric fields; Finite difference methods; Lightning; Magnetic fields; Mathematical model; Time domain analysis; Lightning return stroke; finite-difference time-domain (FDTD) method; lightning electromagnetic pulse (LEMP);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
ISSN :
2158-110X
Print_ISBN :
978-1-4244-6305-3
Type :
conf
DOI :
10.1109/ISEMC.2010.5711303
Filename :
5711303
Link To Document :
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