• DocumentCode
    2486454
  • Title

    An electromagnetics-based parallel transient simulator of linear complexity for the analysis of very large-scale integrated circuits and packages

  • Author

    Chen, Duo ; Jiao, Dan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    396
  • Lastpage
    400
  • Abstract
    A parallel transient electromagnetic simulator of linear complexity and linear speedup is developed to simulate very large-scale integrated circuits and packages from DC to very high frequencies. In this simulator, through suitable basis functions and linear algebraic techniques, we directly and rigorously decompose the original 3-D system matrix into multiple 1-D matrices with negligible computational overhead. Each one-dimensional matrix is made tridiagonal, and hence can be solved readily in linear complexity. We then achieve an almost embarrassingly parallel implementation of the linear-complexity electromagnetic solver with a low communication-to-computation ratio. Numerical experiments on very large-scale integrated circuits and packages have demonstrated superior performance and linear speedup of the proposed parallel transient simulator. It successfully simulates a large-scale combined die-package system from a real product, which involves more than 3.5 billion unknowns, in fast CPU run time.
  • Keywords
    VLSI; electromagnetism; integrated circuit packaging; electromagnetics based parallel transient simulator; linear complexity; linear speedup; multiple 1D matrices; packages; very large-scale integrated circuits; Complexity theory; Computational modeling; Electromagnetics; Finite element methods; Integrated circuit modeling; Matrix decomposition; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711307
  • Filename
    5711307