Title :
Defects and Frequency Mode Patterns in Quartz Plates
Author :
Hearn, E.W. ; Schwuttke, G.H.
Keywords :
Acoustic measurements; Displays; Frequency; Laboratories; Oscillators; Pattern analysis; Q measurement; Resonance; Silicon; Surfaces;
Conference_Titel :
24th Annual Symposium on Frequency Control. 1970
DOI :
10.1109/FREQ.1970.199790
