Title :
A pulse wave simulator for palpation in the oriental medicine
Author :
Shin, Ki Young ; Jin, Seung Oh ; Youn, Su Hyun ; Joo, Su Bin ; Jo, Yo Han ; Kwon, Oh Kyung ; Huh, Young
Author_Institution :
Korea Electrotechnol. Res. Inst., Ansan, South Korea
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Pulse diagnosis, which is one of methods of diagnosis, is an important factor in oriental medicine. However, a problem in diagnosis with the pulse is that there is no objective standard. Therefore, the practitioners pass on the skill and students learn about pulse diagnosis as a method that depends on speech. In this study, the electronic pulse wave reproduction apparatus, which is an objective and accurate means for measuring the pulse, was developed. The previous model reproduced the pulse wave in one part of the point, but it was made by using three pairs of voice coil motors (VCM) in order to similarly express the three parts of the pulse: Cun, Guan and Chi. To evaluate this system, the output of the pulse wave was confirmed in order to reproduce the pulse wave with these settings. Consequently, the targets for slow pulse and rapid pulse have a 7 ms standard deviation, which is within the error tolerance. A voltage value of H1, utilized to verify vacuous pulse and the replete pulse, has a standard deviation range of 4.7-5.4 mV. This system, which is similar to a person´s pulse diagnosis, can be used to educate others in pulse diagnosis both quantitatively and scientifically.
Keywords :
bioelectric phenomena; biomedical equipment; biomedical measurement; patient diagnosis; electronic pulse wave reproduction apparatus; oriental medicine; palpation; person pulse diagnosis; pulse diagnosis; pulse wave simulator; time 7 s; voice coil motors; Arteries; Fingers; Measurement uncertainty; Medical diagnostic imaging; Medical services; Pulse measurements; Voltage measurement; Humans; Medicine, East Asian Traditional; Palpation; Pulse;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091033