• DocumentCode
    2486735
  • Title

    Equivalent transmission-line model for vias connected to striplines in multilayer print circuit boards

  • Author

    Pan, Siming ; Zhang, Jianmin ; Chen, Qinghua B. ; Fan, Jun

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    455
  • Lastpage
    460
  • Abstract
    Vias are typical discontinuities for high-speed signal transmission in printed circuit boards. Previous work has studied the through-hole via connections from the top layer to the bottom between microstrip traces and proposed an equivalent transmission-line model for impedance matching between traces and vias. In this paper, the equivalent transmission-line model is extended for the via structures connected to striplines based on modal decomposition. Both single-ended and differential cases are discussed, and the effects of the model parameters on the performance of signal transition are also investigated. The extended equivalent transmission-line model is accurate and fast to be embedded in circuit simulators for via and link-path analysis. Further, it could provide straightforward criteria to design and optimize via structures for better signal integrity.
  • Keywords
    microstrip components; printed circuit design; strip lines; transmission lines; equivalent transmission-line model; high-speed signal transmission; microstrip traces; multilayer print circuit boards; signal integrity; striplines; through-hole via connections; Cavity resonators; Equivalent circuits; Geometry; Impedance; Integrated circuit modeling; Stripline; Via structures; equivalent transmission-line model; modal decomposition; signal integrity; stripline connection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711318
  • Filename
    5711318