Title :
An evaluation of the immunity characteristics of an LSI with capacitors embedded in an interposer
Author :
Sasaki, Chie ; Saito, Yoshiyuki ; Takahashi, Eiji ; Sugaya, Yasuhiro ; Kobayashi, Hideki
Author_Institution :
Printed Electron. & EMC Technol. Dev. Office, Panasonic Corp., Kadoma, Japan
Abstract :
To improve the electrical characteristics of LSIs, we are developing technology for embedding chip capacitors into interposers for LSIs. In this paper, we applied an interposer with embedded capacitors to an image-processing LSI and compared its electrical characteristics with that of a conventional LSI. We confirmed improvements in the timing margin, signal integrity, and immunity characteristics of the LSI.
Keywords :
capacitors; large scale integration; LSI; capacitors; electrical characteristics; immunity characteristics; interposer; signal integrity; timing margin; Capacitors; Large scale integration; Noise; Pins; Power supplies; Scattering parameters; Timing;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
978-1-4244-6305-3
DOI :
10.1109/ISEMC.2010.5711321
