Title :
Modeling of the immunity of ICs to EFTs
Author :
Zhang, Ji ; Koo, Jayong ; Beetner, Daryl G. ; Moseley, Richard ; Herrin, Scott ; Pommerenke, David
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
Investigation of the immunity of ICs to EFTs is increasingly important. In this paper, an accurate model of a microcontroller is developed and verified. This model consists of two parts: a passive Power Distribution Network (PDN) model and an active I/O protection network model. Measurement methods are designed to extract the parameters of the passive PDN model. The accuracy of the overall model of the IC is verified using both S parameter tests and EFT injection tests. The model is able to accurately predict the voltage and current at power-supply and I/O pins and correctly accounts for the active components of the I/O protection network.
Keywords :
S-parameters; electromagnetic interference; integrated circuit modelling; I/O protection network model; S parameter tests; electrical fast transients; passive PDN model; power distribution network; Clamps; Impedance; Integrated circuit modeling; Pins; Power measurement; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
978-1-4244-6305-3
DOI :
10.1109/ISEMC.2010.5711323
