Double-Weibull distributions of the re-emission spectra from a non-linear device in a mode stirred chamber

Author

Jiaqi, Chen ; Marvin, Andy ; Flintoft, Ian ; Dawson, John

Author_Institution

Dept. of Electron., Univ. of York, York, UK

fYear

2010

fDate

25-30 July 2010

Firstpage

541

Lastpage

546

Abstract

A Double-Weibull distribution of the mean normalised field strength is used to formulate the statistical aspects of re-emission spectra in a reverberation chamber. Cumulative distributions of mean normalised measurement results are used to quantify the degrees of interaction between EUT and RF interference levels. This research is a precursor to digital device immunity diagnostic methodology on the statistics aspects independent from absolute magnitudes.

Keywords

Weibull distribution; radiofrequency interference; reverberation chambers; Double-Weibull distributions; EUT interference levels; RF interference levels; absolute magnitudes; digital device immunity diagnostic methodology; mean normalised field strength; mean normalised measurement; mode stirred chamber; nonlinear device; re-emission spectra; reverberation chamber; statistics aspects; Harmonic analysis; Power harmonic filters; Probability density function; Radio frequency; Scattering; Shape;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on

Conference_Location

Fort Lauderdale, FL

ISSN

2158-110X

Print_ISBN

978-1-4244-6305-3

Type

conf

DOI

10.1109/ISEMC.2010.5711334

Filename

5711334