DocumentCode :
2487176
Title :
Enabling terabit per second switch linecard design through chip/package/PCB co-design
Author :
Chen, Qinghua Bill ; Zhang, Jianmin ; Qiu, Kelvin ; Padilla, Darja ; Yang, Zhiping ; Scogna, Antonio C. ; Fan, Jun
Author_Institution :
Cisco Syst., Inc., San Jose, CA, USA
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
585
Lastpage :
590
Abstract :
Widespread use of the Web 2.0 Internet applications such as video streaming and social networking are continuously demanding higher bandwidth network equipment. Electrical designers increasingly face more and more challenges to deliver higher speed products within short development cycle due to design complexity and new multi-GHz signal integrity problems. This paper presents a modeling and simulation methodology through chip/package/PCB (printed circuit board) co-design and co-optimization to enable a terabit per second network switch linecard design. Channel design techniques such as BGA (Ball Grid Array) pin backdrill, via tuning, and low loss interconnects are outlined. Full wave 3D modeling techniques with optimal model segmentation, model cascading and model optimization are discussed. At the end, correlation between lab measurement and simulation in both frequency and time domains are investigated.
Keywords :
ball grid arrays; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; printed circuit design; telecommunication equipment; Web 2.0 Internet; ball grid array; bandwidth network equipment; channel design; chip/package/PCB codesign; design complexity; full wave 3D modeling; higher speed product; low loss interconnect; model cascading; model optimization; multiGHz signal integrity; optimal model segmentation; pin backdrill; printed circuit board; terabit per second network switch linecard design; Dielectric losses; Insertion loss; Integrated circuit modeling; Loss measurement; Materials; Scattering parameters; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
ISSN :
2158-110X
Print_ISBN :
978-1-4244-6305-3
Type :
conf
DOI :
10.1109/ISEMC.2010.5711342
Filename :
5711342
Link To Document :
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