Title :
Improvement In Jitter Characteristics In Mark Edge Recording For Phase Change Media
Author :
Ohkubo, S. ; Okada, M. ; Murahata, M. ; Ide, T. ; Iwanaga, T.
Author_Institution :
Nec Corporation
Keywords :
Amorphous materials; Crystallization; Disk recording; High speed optical techniques; Jitter; Lenses; Magnetic heads; National electric code; Optical recording; Reflectivity;
Conference_Titel :
Optical Memory and Optical Data Storage, 1993, Conference Digest., Joint International Symposium on
Conference_Location :
Maui, HI, USA
Print_ISBN :
0-7803-1286-4
DOI :
10.1109/OMODS.1993.696726