Title :
Inverse Problem Solution for Multilayered Waveguide and Coaxial Structures
Author_Institution :
Phys. Dept., Saratov State Univ.
Abstract :
The results of full-wave analysis of open and shielded rectangular waveguide and coaxial probes for multilayered substrate structures and its inverse problem solutions for measurement of substrate parameters have been obtained and presented. They have been used for control, test and measurement of substrate parameters, including the implementation of noninvasive methods
Keywords :
coaxial waveguides; inverse problems; multilayers; probes; rectangular waveguides; coaxial probes; coaxial structures; inverse problem solution; multilayered substrate structures; multilayered waveguide; open rectangular waveguide; shielded rectangular waveguide; substrate parameters measurement; Coaxial components; Dielectric measurements; Dielectric substrates; Inverse problems; Kernel; Minimization methods; Neurons; Permittivity measurement; Probes; Testing;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 2006 International Conference on
Conference_Location :
Kharkiv
Print_ISBN :
1-4244-0490-8
DOI :
10.1109/MMET.2006.1689724
