Title :
Simplified Analytical Model and Investigation of Open-Circuit AC Winding Loss of Permanent-Magnet Machines
Author :
Wu, L.J. ; Zhu, Z.Q.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Abstract :
This paper presents a simplified analytical model based on one slot per pole for predicting the open-circuit AC winding loss of surface-mounted permanent-magnet machines accounting for the influence of tooth-tips but neglecting the redistribution effect of eddy currents. The comparison between the analytical models and finite-element results shows that the simplified analytical model has similar accuracy as the analytical model accounting for all slots together. The influence of various design parameters, such as conductor layout, slot width, slot opening width, tooth-tip height, magnet pole-arc to pole-pitch ratio, and gap between tooth-tips and conductors, on the open-circuit AC winding loss is investigated. It shows that the open-circuit AC winding loss gradually decreases with the number of radial conductor layers if the number of circumferential layers is larger than 1, although the radial segmentation is ineffective when there is no circumferential segmentation. The loss decreases greatly when the number of circumferential layers changes from 1 to 2, but reduces slowly when the conductors are further circumferentially segmented.
Keywords :
eddy current losses; finite element analysis; machine windings; magnetic fields; permanent magnet machines; circumferential layers; circumferential segmentation; conductor layout; eddy currents; finite-element results; magnet pole-arc to pole-pitch ratio; open-circuit AC winding loss; radial conductor layers; radial segmentation; redistribution effect; simplified analytical model; slot opening width; surface-mounted permanent-magnet machines; tooth-tip height; tooth-tips gap; Analytical models; eddy current; eddy-current loss; magnetic field; permanent-magnet machines; proximity loss; slotting effect; subdomain model;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2013.2272284