Keywords :
analogue integrated circuits; built-in self test; delays; fault diagnosis; high level synthesis; integrated circuit testing; integrated memory circuits; logic testing; mixed analogue-digital integrated circuits; printed circuit testing; BIST; FPGA testing; I/sub D/DQ testing; analogue testing; board testing; concurrent testing; core-based testing; deep submicron testing; delay testing; fault simulation; functional testing; high level tests; memory testing; mixed-signal testing; scan testing; system testing;
