DocumentCode
2487908
Title
Proceedings IEEE European Test Workshop
fYear
2000
fDate
23-26 May 2000
Keywords
analogue integrated circuits; built-in self test; delays; fault diagnosis; high level synthesis; integrated circuit testing; integrated memory circuits; logic testing; mixed analogue-digital integrated circuits; printed circuit testing; BIST; FPGA testing; I/sub D/DQ testing; analogue testing; board testing; concurrent testing; core-based testing; deep submicron testing; delay testing; fault simulation; functional testing; high level tests; memory testing; mixed-signal testing; scan testing; system testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 2000. Proceedings. IEEE European
Conference_Location
Cascais, Portugal
ISSN
1530-1877
Print_ISBN
0-7695-0701-8
Type
conf
DOI
10.1109/ETW.2000.873770
Filename
873770
Link To Document