• DocumentCode
    2488127
  • Title

    Estimation of the gain and threshold of the stretch reflex with a novel subspace identification algorithm

  • Author

    Jalaleddini, Kian ; Kearney, Robert E.

  • Author_Institution
    Dept. of Biomed. Eng., McGill Univ., Montréal, QC, Canada
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    4431
  • Lastpage
    4434
  • Abstract
    Reflex stiffness is often modeled as a Hammerstein system comprising a cascade of a static nonlinear element and a linear dynamic element. The nonlinearity is frequently modeled as a half wave rectifier so that changes in the reflex response can only be modeled by changes in the parameters of the linear element. This is an oversimplification since there are physiological mechanisms that could change both the threshold of the nonlinearity and the linear dynamics. This study explores the ability of a new subspace identification algorithm to distinguish changes in parameters of the nonlinear element from those of the linear element. Simulation studies demonstrate that the method does so very effectively even in the presence of substantial output noise. Pilot experiments in which the method was applied to stretch reflex EMG data revealed that both the threshold of the nonlinearity and the gain of the linear element change with muscle activation.
  • Keywords
    biomechanics; elastic constants; electromyography; medical signal processing; nonlinear dynamical systems; physiological models; Hammerstein system; gain estimation; half wave rectifier; linear dynamic element; muscle activation; nonlinearity threshold; physiological mechanism; reflex stiffness; static nonlinear element; stretch reflex EMG data; subspace identification algorithm; Electromyography; Estimation; Gain; Joints; Linear systems; Muscles; Torque; Algorithms; Electromyography; Humans; Linear Models; Pilot Projects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6091099
  • Filename
    6091099