Title :
Combining symbolic and genetic techniques for efficient sequential circuit test generation
Author :
Boschini, M. ; Yu, X. ; Fummi, F. ; Rudnick, E.M.
Author_Institution :
ST Microelectron., Milan, Italy
Abstract :
Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases
Keywords :
automatic test pattern generation; binary decision diagrams; finite state machines; genetic algorithms; hardware description languages; logic testing; sequential circuits; state assignment; BDD-based algorithms; FSM with datapath; RTL synthesis; VHDL; circuit decomposition; combined sequences; control logic; datapath sequences generation; genetic algorithms; higher fault coverages; sequential circuit test generation; state transitions; symbolic techniques; Boolean functions; Circuit faults; Circuit testing; Data structures; Electrical fault detection; Genetics; Hybrid power systems; Logic testing; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Workshop, 2000. Proceedings. IEEE European
Conference_Location :
Cascais
Print_ISBN :
0-7695-0701-8
DOI :
10.1109/ETW.2000.873786
