Combining symbolic and genetic techniques for efficient sequential circuit test generation

Author

Boschini, M. ; Yu, X. ; Fummi, F. ; Rudnick, E.M.

Author_Institution

ST Microelectron., Milan, Italy

fYear

2000

fDate

2000

Firstpage

105

Lastpage

110

Abstract

Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases

Keywords

automatic test pattern generation; binary decision diagrams; finite state machines; genetic algorithms; hardware description languages; logic testing; sequential circuits; state assignment; BDD-based algorithms; FSM with datapath; RTL synthesis; VHDL; circuit decomposition; combined sequences; control logic; datapath sequences generation; genetic algorithms; higher fault coverages; sequential circuit test generation; state transitions; symbolic techniques; Boolean functions; Circuit faults; Circuit testing; Data structures; Electrical fault detection; Genetics; Hybrid power systems; Logic testing; Sequential analysis; Sequential circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Workshop, 2000. Proceedings. IEEE European

Conference_Location

Cascais

ISSN

1530-1877

Print_ISBN

0-7695-0701-8

Type

conf

DOI

10.1109/ETW.2000.873786

Filename

873786