DocumentCode
2488432
Title
On Resonance Diffraction of High Frequency Radiation at Periodically Corrugated Semiconductor Surfaces
Author
Balakhonova, N.A. ; Gavrikov, V.K. ; Kats, A.V.
Author_Institution
Usikov Inst. for Radiophys. & Electron., Ukraine Nat. Acad. of Sci., Kharkov
fYear
0
fDate
0-0 0
Firstpage
231
Lastpage
233
Abstract
We show that resonance features analogous to the well known in optics Wood-type anomalies can be observed at THz range on a periodically profiled surface of a high doped semiconductor at low temperatures. The anomalies are caused by surface plasmon polariton excitation at diffraction on the surface. The results are of interest both from physical viewpoint and in view of wide field of possible applications in nowadays information technologies
Keywords
light diffraction; periodic structures; polaritons; surface plasmon resonance; Wood-type anomaly; high doped semiconductor; high frequency radiation; periodically corrugated semiconductor surfaces; periodically profiled surface; resonance diffraction; surface plasmon polariton excitation; Corrugated surfaces; Dielectrics; Diffraction; Frequency; Optical films; Optical surface waves; Permittivity; Plasmons; Resonance; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Mathematical Methods in Electromagnetic Theory, 2006 International Conference on
Conference_Location
Kharkiv
Print_ISBN
1-4244-0490-8
Type
conf
DOI
10.1109/MMET.2006.1689753
Filename
1689753
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