Title :
Exposing digital forgeries from 3-D lighting environments
Author :
Kee, Eric ; Farid, Hany
Author_Institution :
Dept. of Comput. Sci., Dartmouth Coll., Hanover, NH, USA
Abstract :
When creating a photographic composite, it can be difficult to match lighting conditions. We describe a technique for measuring lighting conditions in an image, and describe its use in detecting photographic composites. Specifically, we describe how to approximate a 3-D lighting environment with a low-dimensional model and how to estimate the model´s parameters from a single image. Inconsistencies in the lighting model are then used as evidence of tampering.
Keywords :
copy protection; image coding; lighting; photographic materials; 3D lighting environments; digital forgeries exposition; image tampering; lighting conditions; lighting model inconsistencies; photographic composite detection; Equations; Harmonic analysis; Head; Light sources; Lighting; Mathematical model; Solid modeling;
Conference_Titel :
Information Forensics and Security (WIFS), 2010 IEEE International Workshop on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9078-3
DOI :
10.1109/WIFS.2010.5711437