DocumentCode :
2488933
Title :
Reconfigurable aperture antennas using RF MEMS switches for multi-octave tunability and beam steering
Author :
Schaffner, J.H. ; Loo, R.Y. ; Sievenpiper, D.F. ; Dolezal, F.A. ; Tangonan, G.L. ; Colburn, J.S. ; Lynch, J.J. ; Lee, J.J. ; Livingston, S.W. ; Broas, R.J. ; Wu, M.
Author_Institution :
HRL Labs., Malibu, CA, USA
Volume :
1
fYear :
2000
fDate :
16-21 July 2000
Firstpage :
321
Abstract :
The requirements for increased functionality within a confined volume will place greater burdens on electromagnetic platforms for air, space, and sea over the next few decades. An important piece of the any solution to these new requirements are transmitting and receiving apertures that can handle multi-octave bandwidths with beam steering capability. The ability of an aperture to be reconfigured for a particular mission will become essential. New types of devices are being developed which will enable the realization of these reconfigurable apertures. This paper presents a discussion of how one of these new devices, the RF MEMS switch, can be utilized to change the phase and frequency characteristics of conventional antenna elements to perform beam steering over a wide range of microwave frequencies.
Keywords :
antenna phased arrays; aperture antennas; beam steering; micromechanical devices; microwave antenna arrays; military systems; receiving antennas; switches; transmitting antennas; DARPA RECAP program; RF MEMS switches; air platforms; antenna array; antenna elements; beam steering; electromagnetic platforms; frequency characteristics; microwave frequencies; multi-octave tunability; phase characteristics; receiving apertures; reconfigurable aperture antennas; sea platforms; space platforms; transmitting apertures; Aperture antennas; Bandwidth; Beam steering; Broadband antennas; Contacts; Radar antennas; Radio frequency; Radiofrequency microelectromechanical systems; Residual stresses; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
Type :
conf
DOI :
10.1109/APS.2000.873826
Filename :
873826
Link To Document :
بازگشت