Title :
Modeling Reliability Characteristics of Compound Electromagnetic Systems
Author :
Sydor, A. ; Marunchak, D.
Author_Institution :
Lviv Polytech. Nat. Univ.
Abstract :
A method of investigation of reliability parameters of compound systems by means of generating functions is developed taking account of aging of the system´s output elements. Main reliability characteristics of compound electromagnetic systems are examined in this paper. Expressions for the failure probability, the failure frequency and the failure rate are worked out in the cases when the lifetime of ageing output elements is circumscribed by the Weibull distribution
Keywords :
Weibull distribution; electromagnetic wave diffraction; failure analysis; reliability theory; Weibull distribution; compound electromagnetic systems; failure probability; Aging; Availability; Computational geometry; Electromagnetic analysis; Electromagnetic diffraction; Electromagnetic modeling; Electromagnetic scattering; Exponential distribution; Frequency; Weibull distribution;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 2006 International Conference on
Conference_Location :
Kharkiv
Print_ISBN :
1-4244-0490-8
DOI :
10.1109/MMET.2006.1689786
