Title :
iRULE: fast hot-carrier reliability diagnosis using macro-models
Author :
Teng, Chin-Chi ; Sun, Weishi ; Kang, Sung-Mo ; Fang, Peng ; Yue, John
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
In this paper, we present a new reliability diagnosis tool (iRULE) for the design of hot-carrier resistant MOS circuits. Unlike conventional reliability CAD tools which are usually simulation-based, iRULE is rule-based in nature. The computational complexity of iRULE is linear with respect to the number of transistors. Compared with the circuit-level reliability simulation tools, iRULE is slightly less accurate, but much faster. It makes the reliability diagnosis for VLSI circuits with several million transistors feasible even on a desktop workstation
Keywords :
MOS logic circuits; VLSI; circuit CAD; combinational circuits; computational complexity; fault diagnosis; hot carriers; integrated circuit design; integrated circuit reliability; logic CAD; logic testing; VLSI circuits; computational complexity; desktop workstation; hot-carrier reliability diagnosis; hot-carrier resistant MOS circuits; iRULE; macro-models; reliability CAD tools; reliability diagnosis tool; Analytical models; Circuit simulation; Computational complexity; Computational modeling; Degradation; Hot carriers; Inverters; MOSFETs; Tuned circuits; Very large scale integration;
Conference_Titel :
Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-1886-2
DOI :
10.1109/CICC.1994.379689
