iRULE: fast hot-carrier reliability diagnosis using macro-models

Author

Teng, Chin-Chi ; Sun, Weishi ; Kang, Sung-Mo ; Fang, Peng ; Yue, John

Author_Institution

Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA

fYear

1994

fDate

1-4 May 1994

Firstpage

421

Lastpage

424

Abstract

In this paper, we present a new reliability diagnosis tool (iRULE) for the design of hot-carrier resistant MOS circuits. Unlike conventional reliability CAD tools which are usually simulation-based, iRULE is rule-based in nature. The computational complexity of iRULE is linear with respect to the number of transistors. Compared with the circuit-level reliability simulation tools, iRULE is slightly less accurate, but much faster. It makes the reliability diagnosis for VLSI circuits with several million transistors feasible even on a desktop workstation

Keywords

MOS logic circuits; VLSI; circuit CAD; combinational circuits; computational complexity; fault diagnosis; hot carriers; integrated circuit design; integrated circuit reliability; logic CAD; logic testing; VLSI circuits; computational complexity; desktop workstation; hot-carrier reliability diagnosis; hot-carrier resistant MOS circuits; iRULE; macro-models; reliability CAD tools; reliability diagnosis tool; Analytical models; Circuit simulation; Computational complexity; Computational modeling; Degradation; Hot carriers; Inverters; MOSFETs; Tuned circuits; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Conference_Location

San Diego, CA

Print_ISBN

0-7803-1886-2

Type

conf

DOI

10.1109/CICC.1994.379689

Filename

379689