Title :
Rapid Annealing of Frequency Change in High Frequency Crystal Resonators Following Pulsed X-Irradiation at Room Temperature
Author :
King, J.C. ; Sander, H.H.
Keywords :
Annealing; Circuits; Frequency measurement; Laboratories; Monitoring; Optical resonators; Oscillators; Pulse measurements; Resonant frequency; Temperature;
Conference_Titel :
27th Annual Symposium on Frequency Control. 1973
DOI :
10.1109/FREQ.1973.199948
