Title :
A portable 3-axis 11-bit shock measurement circuit
Author :
Geeter, B.D. ; Pierre, M. ; Nys, O. ; Von Kaenel, V. ; Chevroulet, M. ; Degrauwe, M.
Author_Institution :
CSEM, Neuchatel, Switzerland
Abstract :
An ASIC interfacing 4 micromachined accelerometers has been designed and integrated in a 2 μm technology and has a size of 55 mm 2. It consumes 300 μA at 3 V, has a resolution of 11 bits and a programmable bandwidth of 16 Hz to 200 Hz. Low power operation has been obtained by the introduction of a sleep mode with rapid wake up. The chip has been designed to allow testability without sensor
Keywords :
accelerometers; design for testability; mechanical variables measurement; microsensors; mixed analogue-digital integrated circuits; portable instruments; shock measurement; 16 to 200 Hz; 2 micron; 3 V; 300 muA; ASIC; interface circuit; low power operation; micromachined accelerometers; portable 3-axis measurement circuit; shock measurement circuit; sleep mode; testability; Accelerometers; Application specific integrated circuits; Band pass filters; Circuit testing; Electric shock; Logic programming; Logic testing; Object detection; Semiconductor device measurement; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-1886-2
DOI :
10.1109/CICC.1994.379708
