DocumentCode :
2489737
Title :
Aligning surfaces without aligning surfaces
Author :
Oxholm, Geoffrey ; Nishino, Ko
Author_Institution :
Drexel Univ., Philadelphia, PA, USA
fYear :
2011
fDate :
5-7 Jan. 2011
Firstpage :
174
Lastpage :
181
Abstract :
We introduce a novel method for matching and aligning 3D surfaces that do not have any overlapping surface information. When two matching surfaces do not overlap, all that remains in common between them is a thin strip along their borders. Aligning such fragments is challenging but crucial for various applications, such as reassembly of thin-shell ceramics from their broken pieces. Past work approach this problem by heavily relying on simplistic assumptions about the shape of the object, or its texture. Our method makes no such assumptions; instead, we leverage the geometric and photometric similarity of the matching surfaces along the break-line. We first encode the shape and color of the boundary contour of each fragment at various scales in a novel 2D representation. Reformulating contour matching as 2D image registration based on these scale-space images enables efficient and accurate break-line matching. We then align the fragments by estimating the rotation around the break-line through maximizing the geometric continuity across it with a least-squares minimization. We evaluate our method on real-word colonial artifacts recently excavated in Philadelphia, Pennsylvania. Our system dramatically increases the ease and efficiency at which users reassemble artifacts as we demonstrate on three different vessels.
Keywords :
image matching; image registration; least squares approximations; minimisation; surface fitting; 2D image registration; break-line matching; contour matching; geometric continuity; least-squares minimization; scale-space images; surface alignment; surface matching; Fasteners; Geometry; Image color analysis; Image registration; Shape; Smoothing methods; Three dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Computer Vision (WACV), 2011 IEEE Workshop on
Conference_Location :
Kona, HI
ISSN :
1550-5790
Print_ISBN :
978-1-4244-9496-5
Type :
conf
DOI :
10.1109/WACV.2011.5711500
Filename :
5711500
Link To Document :
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