• DocumentCode
    2489825
  • Title

    Dependability engineering of complex computing systems

  • Author

    Kaaniche, M. ; Laprie, Jean-Claude ; Blanquart, Jean-Paul

  • Author_Institution
    Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    36
  • Lastpage
    46
  • Abstract
    The paper presents a development model focused on the production of dependable systems. Three classes of processes are distinguished: 1) the system creation process which builds on the classical development steps (requirements, design, realization, integration); 2) dependability processes (i.e., fault prevention, fault tolerance, fault removal and fault forecasting); and 3) other supporting processes such as quality assurance and certification. The proposed approach relies on the identification of basic activities for the system creation process and for the dependability processes, and then on the analysis of the interactions among the activities of each process and with the other processes. Finally, to support the development of dependable systems, we define for each system creation activity, a checklist that specifies the key issues related to fault prevention, fault tolerance, fault removal, and fault forecasting, that need to be addressed
  • Keywords
    certification; software quality; software reliability; certification; checklist; classical development steps; complex computing systems; dependability engineering; dependability processes; dependable systems; development model; fault forecasting; fault prevention; fault removal; fault tolerance; quality assurance; supporting processes; system creation activity; system creation process; Application software; Certification; Fault tolerance; Fault tolerant systems; Hardware; IEC standards; Predictive models; Production systems; Quality assurance; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering of Complex Computer Systems, 2000. ICECCS 2000. Proceedings. Sixth IEEE International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-7695-0583-X
  • Type

    conf

  • DOI
    10.1109/ICECCS.2000.873926
  • Filename
    873926