DocumentCode
2489841
Title
Domain modeling of software process models
Author
Gomaa, Hassan ; Kerschberg, Larry ; Farrukh, Ghulam A.
Author_Institution
George Mason Univ., Fairfax, VA, USA
fYear
2000
fDate
2000
Firstpage
50
Lastpage
60
Abstract
The paper presents a novel application involving two important software engineering research areas: process modeling and software reuse. The Spiral Model is a risk-driven process model, which, depending on the specific risks associated with a given project, may be tailored to create a project-specific process model. The software reuse area is that of domain modeling of families of systems, which capture the similarities and variations among the members of the family. The domain modeling approach is used to create a domain model of a Spiral Process Model (SPM), thereby capturing the similarities and variations among a family of process models. The SPM domain model has been extended to capture the key process areas of the Software Engineering Institute´s Capability Maturity Model (CMM). The domain model is used to generate project-specific process models. This approach allows managers to configure and reuse process models that manage the risks associated with new software development
Keywords
configuration management; risk management; software development management; software process improvement; software reusability; CMM; Capability Maturity Model; SPM domain model; Spiral Process Model; domain model; domain modeling; domain modeling approach; process modeling; project-specific process model; project-specific process models; risk management; risk-driven process model; software development; software engineering research areas; software process models; software reuse; Aggregates; Coordinate measuring machines; Jacobian matrices; Joining processes; Kernel; Libraries; Object oriented modeling; Programming; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering of Complex Computer Systems, 2000. ICECCS 2000. Proceedings. Sixth IEEE International Conference on
Conference_Location
Tokyo
Print_ISBN
0-7695-0583-X
Type
conf
DOI
10.1109/ICECCS.2000.873927
Filename
873927
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